Smart Poly (N-isopropylacrylamide)-Based Hydrogels: A Tour D
Hydrogels are innovative materials characterized by a water-swollen, crosslinked polymeric network capable of retaining substantial amounts of water while maintaining structural
Plasma
Photonic
Burnin
Fast
PON
Recent progress in fast-ion diagnostics for magnetically confined
Recent developments in the diagnostic of fast-ion distributions have significantly improved our predictive capabilities towards future devices. Here, we review key diagnostic
Flash Lamp Annealing
Flash Lamp Annealing ist ein thermisches Nachbehandlungsverfahren, bei dem Oberflächen im Bruchteil einer Sekunde aufgeheizt werden, wodurch Materialeigenschaften verändert werden, ohne
Model 58604 | Chroma ATE, Inc. (USA)
Burn-In, reliability, and life test ACC and APC control modes Individual channel source and measurement Spike-Free sourcing Current to 500mA per channel or parallel up Precise temperature
Advanced Optical Integration Processes for Photonic‐Integrated
Photonic integrated chip packaging is a growing technology that helps make devices faster, more efficient, and more compact by using light instead of electricity. This review highlights
Beam-powered propulsion
Beam-powered propulsion, also known as directed energy propulsion, is a class of aircraft or spacecraft propulsion that uses energy beamed to the spacecraft from a remote power plant to provide energy.
Aehr Receives Order for FOX-XP™ System for Production Wafer Level Burn
This FOX-XP multi-wafer test and burn-in system is configured to enable cost-effective production test of the next generation of silicon photonics ICs, which can require up to two to four
Fast particle Bremsstrahlung effects in the PIC code EPOCH
Particle in Cell (PIC) codes such as EPOCH are key tools for understanding laser plasma interaction in both long and short pulse driven high energy density physics (HEDP) experiments on laser
Why is Plasma Engineering in Fast Recovery Diodes by Ion Irradiation
To control the injection efficiency of the anode two state of the art technologies, the reduction of the emitter doping and the ion irradiation in the p-doping region are compared in this paper.
Refinement of thin-films by in-line flash lamp annealing
We have an in-line flash lamp module for dynamic annealing of samples with a maximum size of 1200 × 600 mm2 and a maximum flash power of 50 J/ cm2. The module is integrated into the ILA 900
Design of transient plasma photonic structure mirrors for high-power
Machine learning is used to design and optimise compact, robust plasma photonic mirrors for ultra-powerful lasers. This approach yields a range of high-reflectivity plasma-based optical
The Importance of automated burn-in and test of photonic integrated
The importance of burn-in and test data To succeed, PICs need to be not just fast, but reliably fast. For light sources, this means applying a burn-in process - in other words, running
Chroma 58606 Photodiode Burn-in and Reliability Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction, and temperature controlled module based system for photo diode burn-in and lifetime test.
Photonics Solution | Chroma ATE, Inc. (USA)
Chroma''s photonics test solutions address mainly on automated test equipment for laser diode, VSCEL, LED both in wafer and chip format as well as optical communication active components. With more
High-performance analog signal processing with photonic
The role and the impact of analog photonic processing are getting more and more evident and its penetration is expected both in high-performance computing systems and in edge
Aehr ships new high-power-configured FOX-XP system for wafer-level burn
The FOX-XP multi-wafer test and burn-in system is configured to enable cost-effective volume production test of wafers of next-generation photonic ICs, which can require up to 2–4 times
Aehr Receives Follow-On Order for Fully Automated
Fremont, CA (March 3, 2026) – Aehr Test Systems (NASDAQ: AEHR), a leading provider of test and burn-in solutions for semiconductor devices used in artificial
Ultrafast coherent dynamics of microring modulators | Nature Photonics
An ultra-compact, ultra-wide-bandwidth in-phase/quadrature modulator on a silicon chip is demonstrated, enabling coherent transmission for symbol rates up to 180 Gbaud and a net bit rate
Chroma Photonics Test Solutions
These lab class instruments are often integrated into production solutions for wafer probe test, burn-in and device or module characterization then reinforced with inspection, metrology, robotics, Industry
Fast Recovery
We stock a large selection of Fast Recovery Rectifiers including Fast Recovery Stud Mount packages from 200-450 amps; Fast Recovery Hockey Puk packages from 350-1825 amps; Fast Recovery
Aehr Announces Shipment of New High-Power Configured FOX-XP
Aehr Test Systems, a worldwide supplier of semiconductor test and burn-in equipment, today announced it has shipped the first order from a major silicon photonics customer for a new high
Aehr Receives Follow-On Order for Fully Automated
Aehr believes it is the first company to successfully demonstrate and ship a multi-wafer burn-in solution for silicon photonics transceivers, enabling
Aehr Announces Shipment of New High-Power Configured FOX-XP™
This FOX-XP multi-wafer test and burn-in system is configured to enable cost-effective volume production test of wafers of next-generation photonic ICs, which can require up to two to four
Linear Photonics Products
MACOM''s Linear Photonics product team designs, develops and manufactures state-of-the-art RF-over-fiber components, modules and systems. The team has the capability to design component, modular,
Aehr ships new high-power-configured FOX-XP system for wafer-level
Semiconductor production test and reliability qualification equipment supplier Aehr Test Systems of Fremont, CA, USA has shipped the first order from a major silicon photonics customer for
Xenon plasma-focused ion beam milling as a method to
We have shown that Xe-PFIB technology can be effectively combined with fast PL imaging of self-assembled quantum dot structures to create photonic devices with well-controlled parameters.